SNUG France 
Spotlight

23 June, 2011 

Grenoble, France
Grenoble World Trade Center

Synopsys technology users attended SNUG France on 10 June, 2010.
We hope to see you next year in 2011!

 


SNUG thanks the members of the Technical Committee who volunteer their time and expertise to ensure SNUG’s technical quality, local perspective and value to the users of Synopsys tools and technology.

User Technical Chairperson
Frank Poppen, OFFIS Research Institute

Members
Alessandro Valerio, STMicroelectronics
Alkiviadis Boulos, Jaguar & Land Rover
Bernhard Hecker, Infineon Technologies
Chris Byham, Imagination Technologies
Claus Kuntzsch, Texas Instruments
Evagelia Diamantakou, Intracom
Herbert Taucher, Siemens AG Austria
Hichem Belhadj, Actel Corp.
Jens Stapelfeldt, Doulos
Jerome Bombal, Texas Instruments
Justin Mitchell, BBC
Karsten Matt, Global Foundries
Laurent Besson, ST-Ericsson
Majid Ghameshlu, Siemens AG Austria
Marcello Vena, Independent
Marcus Schmidt, Independent
Mike Bartley, Test and Verification Solutions Ltd
Nicolas Verkinderen, Texas Instruments
Norbert Schuhmann, Fraunhofer Institute Integrated Circuits
Patrick Richier, ST-Ericsson
Paul Fugger, Infineon Technologies
Peter Bell, Synopsys (Northern Europe) Ltd.
Pierluigi Daglio, STMicroelectronics
Rainer Mann, Global Foundries
Ralf Leuchter, Infineon Technologies AG
Richard Illman, Dialog Semiconductor
Robert Fairlie, Verilab Ltd.
Shalom Bresticker, Intel
Stuart Vernon, Imagination Technologies
Sylvie Pierunek, STMicroelectronics
Tiana Rahaga, EASII IC
Tobias Thiel, Freescale Semiconductor
Wolfgang Roessel, Alcatel