Key Benefits

• Test synthesis - concurrent with physical implementation, power and timing optimization - speeds closure of test-ready designs
• Test data compression and tester time reduction using DFT MAX dramatically reduces tester costs
• Highest quality test patterns using TetraMAX® ATPG, the industry's most advanced solution for targeting nanometer defects
• Graphical debug environment with waveform viewer quickly isolates and corrects causes of DFT problems that tend to create project bottlenecks
• Integration of ATPG with the PrimeTime® golden delay calculator enables highly accurate at-speed testing of critical paths
• Foundry-proven yield diagnostics with links to the Milkyway™ design database provides a seamless flow from design to manufacturing

The Challenges of Nanometer Test
Design organizations face the challenge of meeting their quality goals in the presence of ever more subtle types of defects prevalent in nanometer processes. They are further challenged with higher costs related to meeting their quality goals and from increased design complexity enabled by process innovations.

Solution
To meet these challenges, designers have chosen Galaxy Test, a comprehensive ATPG and scan compression solution that has been consistently proven in silicon to predictably achieve the highest test quality while dramatically reducing the costs of test. This award-winning solution includes DFT Compiler™, DFT MAX, and TetraMAX ATPG products. These tools work together within the Galaxy Design Platform to eliminate costly and time-consuming design iterations between front-end and back-end flows, achieving rapid DFT closure and sign-off for even the most complex SoCs.

For more information about this product, please contact your local Synopsys representative or call 1-800-388-9125.

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